First-Principles Study of Schottky Barrier Heights on Metal/4H-SiC Polar ...
New Insights into the Interface Trap Generation during Hot Carrier Degrad...
Across-dimensional optical constellation de-aggregations from QAMs to PAM...
Towards Fully Decoupled End-to-End Person Search   (Open Access)
Comprehensive Study of NBTI and Off-State Reliabilty in Sub-20 nm DRAM Te...
An Ultrasensitive Ti3C2Tx MXene-based Soft Contact Lens for Continuous an...
Analysis of the Thickness of Multilayered Porous Silicon in the Cold Emis...
Study on Quantum Well Intermixing Induced by Zn Impurities in GaInP/AlGaI...
Deep-ultraviolet LEDs with an Al-graded p-AlGaN layer exhibiting high wal...
 Effect of junction temperature on 1.3 µm InAs/GaAs quantum dot lasers ...
官方微信
友情链接

High temperature mid-wave infrared InAsSb barrier photodetectors

2024-03-08


Xue, Ting; Huang, Jianliang; Zhang, Yanhua; Ma, Wenquan Source: IEEE Journal of Quantum Electronics, p 1-1, 2024;

Abstract:

We report on mid-wave infrared InAsSb photodetectors with high-barrier materials implemented in the depletion region. The devices exhibit promising performance at high temperature. At 160 K, the 50% cutoff wavelength is 4.18 μm, and the shot noise limited detectivity D* is 1.57×10 cm·Hz/W for the peak wavelength of 3.79 μm. At 300 K, the 50% cutoff wavelength is 4.70 μm, and the D* is 4.87×10 cm·Hz/W for the peak response wavelength of 4.15 μm. The dark current of the device is found to be dominated by the diffusion current rather than the generation-recombination current for the temperature range of 160-300 K. We also determine the Varshni parameters of the InAsSb material with varying strain, and the bandgap bowing parameters.

IEEE




关于我们
下载视频观看
联系方式
通信地址

北京市海淀区清华东路甲35号(林大北路中段) 北京912信箱 (100083)

电话

010-82304210/010-82305052(传真)

E-mail

semi@semi.ac.cn

交通地图
版权所有 中国科学院半导体研究所

备案号:京ICP备05085259-1号 京公网安备110402500052 中国科学院半导体所声明